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 6N135,6N136
TOSHIBA Photocoupler GaAAs Ired & Photo IC
6N135, 6N136
Digital Logic Isolation. Line Receiver. Power Supply Control Switching Power Supply Transistor Inverter
Unit in mm
The TOSHIBA 6N135 and 6N136 consists of a high emitting diode and a one chip photo diode-transistor. Each unit is 8-lead DIP package.
* * * * *
Isolation voltage: 2500Vrms (min.) High speed: tpHL, tpLH = 0.5s (typ.) (RL = 1.9k) TTL compatible If base pin is open, output signal will be noisy by environmental condition. For this base, TLP550 is suitable UL recognized: UL1577, file no. E67349 TOSHIBA Weight: 0.54g 11-10C4
Pin Configurations
1 2 3 4 8 7 6 5
1 : N.C. 2 : ANODE 3 : CATHODE 4 : N.C. 5 : EMITTER 6 : COLLECTOR 7 : BASE, ANODE 8 : CATHODE
ICC IF VF 2 3 IB IO 8 VCC 7 VB 6 VO 5 GND
1
2007-10-01
6N135,6N136
Absolute Maximum Ratings (Ta = 25C)
Characteristic Forward current Pulse forward current LED Total pulse forward current Reverse voltage Diode power dissipation Output current Peak output current Detector Emitter-base reverse voltage (pin 5-7) Supply voltage Output voltage Base current (pin 7) Output power dissipation Operating temperature range Storage temperature range Lead solder temperature (10s) Isolation voltage (Note 6) (Note 7) (Note 5) (Note 4) (Note 1) (Note 2) (Note 3) Symbol IF IFP IFPT VR PD IO IOP VEB VCC VO IB Po Topr Tstg Tsol BVS Rating 25 50 1 5 45 8 16 5 -0.5~15 -0.5~15 5 100 -55~100 -55~125 260 2500 Unit mA mA A V mW mA mA V V V mA mW C C C Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) (Note 2) (Note 3) (Note 4) (Note 5) (Note 6) (Note 7) Derate 0.8mA above 70C. 50% duty cycle, 1ms pulse width. Derate 1.6mA / C above 70C. Pulse width 1s, 300pps. Derate 0.9mW / C above 70C. Derate 2mW / C above 70C. Soldering portion of lead: Up to 2mm from the body of the device. R.H. 60%, AC / 1min.
2
2007-10-01
6N135,6N136
Electrical Characteristics Over Recommended Temperature (Ta = 0C~70C unless otherwise noted)
Characteristic 6N135 Current transfer ratio 6N136 6N135 6N136 Logic low output voltage 6N135 VOL 6N136 Symbol CTR Test Condition IF = 16mA, VO = 0.4V VCC = 4.5V, Ta = 25C IF = 16mA, VO = 0.5V VCC = 4.5V IF = 16mA, IO = 1.1mA VCC = 4.5V IF = 16mA, IO = 2.4mA VCC = 4.5V IF = 0mA, VO = VCC = 5.5V Ta = 25C IF = 0mA, VO = VCC = 15V Ta = 25C IF = 0 mA, VO = VCC = 15V IF = 16mA, VO = open VCC = 15V IF = 0mA, VO = open VCC = 15V, Ta = 25C IF = 0mA, VO = open VCC = 15V IF = 16mA, Ta = 25C IF = 16mA IR = 10A, Ta = 25C f = 1MHz, VF = 0 VI-O = 500V R.H. 60% f = 1MHz VO = 5V, IO = 3mA (Note 9) (Note 9) Min. 7 (Note 8) 19 5 (Note 1) 15 5 (**)Typ. 18 24 13 21 0.1 0.1 3 0.1 40 0.01 1.65 -1.9 60 10
12
Max. 0.4 0.4 500 1 50 1 2 1.7
Unit % % % % V V nA A A A A A V mV / C V pF pF
CTR
Logic high output current
IOH
IOH Logic low supply current ICCL ICCH Logic high supply current ICCH Input forward voltage Temperature coefficient of forward voltage Input reverse breakdown voltage Input capacitance Resistance (input-output) Capacitance (input-output) Transistor DC current gain VF VF / Ta BVR CIN RI-O CI-O hFE
0.6 80
(**) All typicals at Ta = 25C
3
2007-10-01
6N135,6N136
Switching Specifications
Characteristic Propagation delay time to logic low at output Propagation delay time to logic high at output Common mode transient immunity at logic high level output (Note 10) 6N135 6N136 6N135 6N136 6N135 CMH 6N136 2
(unless otherwise specified. Ta = 25C, VCC = 5V, IF = 16mA)
Symbol tpHL Test Circuit 1 Test Condition RL = 4.1k RL = 1.9k RL = 4.1k RL = 1.9k IF = 0mA VCM = 10Vp-p RL = 4.1k IF = 0mA VCM = 10Vp-p RL = 1.9k VCM = 10Vp-p RL = 4.1k IF = 16mA VCM = 10Vp-p RL = 1.9k IF = 16mA RL = 100 Min. Typ. 0.2 0.2 1.0 0.5 1000 Max. 1.5 0.8 1.5 0.8 Unit s s s s V / s
tpLH
1
1000
V / s
Common mode transient immunity at logic low level output (Note 10) Bandwidth
6N135 CML 6N136 (Note 11) BW 2
-1000
V / s

-1000 2

V / s MHz
(Note 8) (Note 9) (Note 10)
(Note 11)
DC current transfer ratio is defined as the ratio of output collector current, IO, to the forward LED input current, IF, times 100%. Device considered a two-terminal device: Pins 1, 2, 3, and 4 shorted together and pins 5, 6, 7 and 8 shorted together. Common mode transient immunity in logic high level is the maximum tolerable (positive) dvCM / dt on the leading edge of the common mode pulse, VCM, to assure that the output will remain in a logic high state (i.e., VO > 2.0V). Common mode transient immunity in logic low level is the maximum tolerable (negative) dvCM / dt on the trailing edge of the common mode pulse signal, VCM, to assure that the output will remain in a logic low state (i.e., VO < 0.8V). The frequency at which the AC output voltage is 3dB below the low frequency asymptote.
4
2007-10-01
6N135,6N136
Test Circuit 1.
PULSE GEN. Zo = 50 tf = 5ns 10% DUTY CYCLE IF MONITOR IF
IF 0 VO 1.5V 1.5V 5V
1 2 3
8 7 6 5 RL
5V
tpHL
tpLH
100
VOL
4
VO (*) CL
(*) CL is approximately 15PF which includes probe and stray wiring capacitance.
Test Circuit 2.
IF 10V VCM 0V VO SWITCH AT A : IF = 0mA VO SWITCH AT B : IF = 16mA VOL tr, tf = 8ns 10% 90% 90% 10% tf tr 5V A B VFF
1 2 3 4 VCM PULSE GEN.
8 7 6 5 RL
5V
VO
5
2007-10-01
6N135,6N136
IF - V F
100 50 30
VF / Ta - IF
-2.6
Forward voltage temperature coefficient VF / Ta (mV / C )
Ta = 25C
(mA)
-2.4
10 5 3 1 0.5 0.3 0.1 0.05 0.03 0.01 1.0
Forward current
IF
-2.2
-2.0
-1.8
-1.6
1.2
1.4
1.6
1.8
2.0
-1.4 0.1
0.3
0.5
1
3
5
10
30
Forward voltage
VF
(V)
Forward current
IF
(mA)
IOH (1) - Ta
300 10 5
IO - IF
High level output current IOH(1) (nA)
50 30
(mA) IO Output current
100
3 1 0.5
10 5 3
0.3 0.1 0.05 0.03 VCC = 5V VO = 0.4V Ta = 25C
1 0.6 0 40 80 120 160 0.01 0.1 0.3 0.5 1 3 5
10
30 50 100
300
Ambient temperature
Ta
(C)
Forward current
IF
(mA)
IO / IF IF
100 VCC = 5V VO = 0.4V 1.0 1.2
IO / IF - Ta
50
Current transfer ratio IO / IF (%)
I O / IF Notmalized
30
Ta = -25C 25C
0.8
10 5 3
100C
0.6
Normalized TO : IF = 16mA VCC = 4.5V VO = 0.4V
0.4
0.2
1 0.3 0.5 1 3 5 10 30 50
-40
0
-20
0
20
40
60
80
100
Forward current
IF
(mA)
Ambient temperature
Ta
(C)
6
2007-10-01
6N135,6N136
IO - VO
30mA 10 25mA 8 20mA 15mA VCC = 5V Ta = 25C 5
V O - IF IF (V )
4
VCC=5V RL
(mA)
IO
VO
VO
3
Output current
Output voltage
6
Ta = 25
2 RL = 2k 3.9 1 10
4
10mA
2
IF = 5mA
0
0 0 1 2 3 4 5 6 7 0 4 8 12 16 20 24
Output voltage
VO
(V)
Forward current
IF
(mA)
tpHL, tpLH - RL
5 3 IF = 16mA VCC = 5V Ta = 25C tpLH
Propagation delay time tpHL, tpLH (s)
1
0.5 0.3 tpHL
0.1 1
3
5
10
30
50
100
Load resistance
RL
(k)
7
2007-10-01
6N135,6N136
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
8
2007-10-01


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